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EXTREME ULTRAVIOLET EXPLORER SPECTROMETER

被引：45
作者：
HETTRICK, MC
BOWYER, S
MALINA, RF
MARTIN, C
MROWKA, S
机构：
来源：
APPLIED OPTICS | 1985年 / 24卷 / 12期
关键词：
D O I：
10.1364/AO.24.001737
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
引用
收藏
页码：1737 / 1756
页数：20
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