A SUMMARY OF LOW-ANGLE X-RAY ATOMIC SCATTERING FACTORS MEASURED BY THE CRITICAL VOLTAGE EFFECT IN HIGH-ENERGY ELECTRON-DIFFRACTION

被引：29

作者：

FOX, AG ^{[1
]}

FISHER, RM ^{[1
]}

机构：

[1] UNIV CALIF BERKELEY LAWRENCE BERKELEY LAB,CTR ADV MAT,BERKELEY,CA 94720

来源：

AUSTRALIAN JOURNAL OF PHYSICS | 1988年 / 41卷 / 03期

关键词：

D O I：

10.1071/PH880461

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

引用

页码：461 / 468

页数：8

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