A SUMMARY OF LOW-ANGLE X-RAY ATOMIC SCATTERING FACTORS MEASURED BY THE CRITICAL VOLTAGE EFFECT IN HIGH-ENERGY ELECTRON-DIFFRACTION

被引:29
作者
FOX, AG [1 ]
FISHER, RM [1 ]
机构
[1] UNIV CALIF BERKELEY LAWRENCE BERKELEY LAB,CTR ADV MAT,BERKELEY,CA 94720
来源
AUSTRALIAN JOURNAL OF PHYSICS | 1988年 / 41卷 / 03期
关键词
D O I
10.1071/PH880461
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
引用
收藏
页码:461 / 468
页数:8
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