CHARACTERIZATION OF RAMAN-SPECTRA IN NANO-SNO2 SOLIDS

被引：27

作者：

XIE, CY ^{[1
]}

ZHANG, LD ^{[1
]}

MO, CM ^{[1
]}

机构：

[1] UNIV SCI & TECHNOL CHINA,DEPT MAT SCI & ENGN,HEFEI,PEOPLES R CHINA

来源：

PHYSICA STATUS SOLIDI A-APPLIED RESEARCH | 1994年 / 141卷 / 01期

关键词：

D O I：

10.1002/pssa.2211410138

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

[No abstract available]

引用

页码：K59 / K61

页数：3

共 5 条

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[2] POLYCRYSTALLINE SILICON FILMS DEPOSITED IN A GLOW-DISCHARGE AT TEMPERATURES BELOW 250-DEGREES-C
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