INSITU, REAL-TIME MONITORING OF ELECTRODE SURFACES BY SCANNING TUNNELING MICROSCOPY - CONSTRUCTION OF AN STM SYSTEM AND ITS APPLICATION TO ELECTRODEPOSITION OF COPPER ON POLYCRYSTALLINE PLATINUM

被引:42
作者
UOSAKI, K
KITA, H
机构
来源
JOURNAL OF ELECTROANALYTICAL CHEMISTRY | 1989年 / 259卷 / 1-2期
关键词
D O I
10.1016/0022-0728(89)80054-3
中图分类号
O65 [分析化学];
学科分类号
070302 ; 081704 ;
摘要
引用
收藏
页码:301 / 308
页数:8
相关论文
共 14 条
[1]  
BARD AJ, 1980, ELECTROCHEMICAL METH, pCH14
[2]  
BERTOCCI U, 1974, ENCY ELECTROCHEMISTR, V2, pCH2
[3]   SCANNING TUNNELING MICROSCOPY OF PROCESSES AT LIQUID SOLID INTERFACES [J].
DRAKE, B ;
SONNENFELD, R ;
SCHNEIR, J ;
HANSMA, PK .
SURFACE SCIENCE, 1987, 181 (1-2) :92-97
[4]   SCANNING TUNNELING MICROSCOPY [J].
HANSMA, PK ;
TERSOFF, J .
JOURNAL OF APPLIED PHYSICS, 1987, 61 (02) :R1-R23
[5]   SCANNING TUNNELING MICROSCOPE FOR ELECTROCHEMISTRY - A NEW CONCEPT FOR THE INSITU SCANNING TUNNELING MICROSCOPE IN ELECTROLYTE-SOLUTIONS [J].
ITAYA, K ;
TOMITA, E .
SURFACE SCIENCE, 1988, 201 (03) :L507-L512
[6]   SCANNING TUNNELING MICROSCOPY WITH ATOMIC RESOLUTION IN AQUEOUS-SOLUTIONS [J].
ITAYA, K ;
SUGAWARA, S .
CHEMISTRY LETTERS, 1987, (10) :1927-1930
[7]   THE APPLICATION OF SCANNING TUNNELING MICROSCOPY TO INSITU STUDIES OF NICKEL ELECTRODES UNDER POTENTIAL CONTROL [J].
LEV, O ;
FAN, FR ;
BARD, AJ .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1988, 135 (03) :783-784
[8]  
LUI HY, 1986, J AM CHEM SOC, V108, P3838
[9]   SCANNING TUNNELING MICROSCOPY AT POTENTIAL CONTROLLED ELECTRODE SURFACES IN ELECTROLYTIC ENVIRONMENT [J].
LUSTENBERGER, P ;
ROHRER, H ;
CHRISTOPH, R ;
SIEGENTHALER, H .
JOURNAL OF ELECTROANALYTICAL CHEMISTRY, 1988, 243 (01) :225-235
[10]   INSITU X-RAY-DIFFRACTION STUDY OF HYDROGEN ENTRY INTO PD AND PD-AU ALLOY ELECTRODES DURING ANODIC HCHO OXIDATION [J].
MACHIDA, K ;
ENYO, M .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1987, 134 (06) :1472-1474