CHANGE IN THICKNESS AND OTHER OPTICAL PROPERTIES OF ULTRAVIOLET IRRADIATED SILICON OXIDE FILMS

被引：12

作者：

HODGKINSON, IJ

机构：

来源：

APPLIED OPTICS | 1970年 / 9卷 / 07期

关键词：

D O I：

10.1364/AO.9.001577

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

引用

页码：1577 / +

页数：1

共 12 条

[1]

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HASS, C .

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[3]

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[6] STRESS IN FILMS OF SILICON MONOXIDE [J].

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[7]

JACOBSON R, 1965, PROGR OPTICS, V5, P249

[8] DIE OPTISCHEN EIGENSCHAFTEN DIELEKTRISCHER SCHICHTEN MIT KLEINEN HOMOGENITATSSTORUNGEN [J].

KOPPELMANN, G ;

KREBS, K .

ZEITSCHRIFT FUR PHYSIK, 1961, 163 (01) :539-+

[9] OPTICAL CONSTANTS OF SILVER, GOLD, COPPER, AND ALUMINUM .2. THE INDEX OF REFRACTION-N [J].

SCHULZ, LG ;

TANGHERLINI, FR .

JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1954, 44 (05) :362-368

[10] THE OPTICAL CONSTANTS OF SILVER, GOLD, COPPER, AND ALUMINUM .1. THE ABSORPTION COEFFICIENT-K [J].

SCHULZ, LG .

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