CHARGE TRAPPING LEVELS IN VACUUM-EVAPORATED POLYVINYLIDENE FLUORIDE FILMS

Thermally stimulated discharge current (TSD) behavior of vacuum evaporated polyvinylidene fluoride films (approximately 5000 angstrom) has been studied at different polarization fields (2.0 X 10(3)-1.8 X 10(4) V cm-1) and temperatures (333-393 K). The TSD spectra of these films show a single relaxation peak the position and activation energy of which depends on the polarization parameters. The origin of the peak has been attributed to the migration of the charge carriers, injected from the electrodes, at the macroscopic distances and their subsequent trapping; the trapping levels being distributed in their energies and lie between 0.46 and 0.72 eV, respectively.