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COMPUTER-AIDED QUANTIFICATION OF AES AND XPS SPECTRA

被引：20
作者：
MOIR, PA
FITZGERALD, AG
STOREY, BE
机构：
来源：
SURFACE AND INTERFACE ANALYSIS | 1989年 / 14卷 / 6-7期
关键词：
D O I：
10.1002/sia.740140605
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
引用
收藏
页码：295 / 301
页数：7
相关论文
共 27 条
[21]   QUANTITATIVE XPS - THE CALIBRATION OF SPECTROMETER INTENSITY ENERGY RESPONSE FUNCTIONS .2. RESULTS OF INTERLABORATORY MEASUREMENTS FOR COMMERICAL INSTRUMENTS [J].
SEAH, MP ;
JONES, ME ;
ANTHONY, MT .
SURFACE AND INTERFACE ANALYSIS, 1984, 6 (05) :242-254
[22]   DATA COMPILATIONS - THEIR USE TO IMPROVE MEASUREMENT CERTAINTY IN SURFACE-ANALYSIS BY AES AND XPS [J].
SEAH, MP .
SURFACE AND INTERFACE ANALYSIS, 1986, 9 (1-6) :85-98
[23]  
SEAH MP, 1983, SCANNING ELECTRON MI, V2, P521
[24]   QUANTITATIVE-ANALYSIS BY AUGER-ELECTRON SPECTROSCOPY [J].
SHIMIZU, R .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1983, 22 (11) :1631-1642
[25]  
TANUMA S, 1987, SURF SCI, V192, pL849, DOI 10.1016/S0039-6028(87)81156-1
[26]  
TIMOTHY AF, 1971, ACTA ELECTRON, V14, P159
[27]  
VULLI M, 1978, J MICROSC SPECT ELEC, V3, P57
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