EXAFS MEASUREMENTS FOR LIQUID AS2SE3 AT HIGH-TEMPERATURES AND PRESSURES

被引:33
作者
TAMURA, K
HOSOKAWA, S
INUI, M
YAO, M
ENDO, H
HOSHINO, H
机构
[1] HIROSAKI UNIV,FAC EDUC,HIROSAKI,AOMORI 036,JAPAN
[2] KYOTO UNIV,FAC SCI,DEPT PHYS,KYOTO 606,JAPAN
[3] KYUSHU UNIV,COLL GEN EDUC,FUKUOKA 810,JAPAN
关键词
D O I
10.1016/0022-3093(92)90151-9
中图分类号
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Extended X-ray absorption fine structure (EXAFS) spectra from liquid As2Se3 around both the As and Se K-edges in the temperature-pressure range up to 1400-degrees-C and about 60 bar were measured. For the EXAFS measurements, a new type of high pressure vessel and a sample cell of own design made of polycrystalline sapphire were developed. Distinct EXAFS oscillations were obtained even at 1400-degrees-C. When the semiconductor-to-metal transition occurs at about 1000-degrees-C, the local environment around a central As atom is substantially changed and a new As neighbor site is induced.
引用
收藏
页码:351 / 355
页数:5
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