Z-SCAN MEASUREMENT OF CHI(3) USING TOP-HAT BEAMS

被引:101
作者
ZHAO, W [1 ]
PALFFYMUHORAY, P [1 ]
机构
[1] KENT STATE UNIV,DEPT PHYS,KENT,OH 44242
关键词
D O I
10.1063/1.112264
中图分类号
O59 [应用物理学];
学科分类号
摘要
Z-scan measurements of third-order optical nonlinearities are usually carried out with Gaussian beams. Good quality Gaussian beams are not readily available, however, and to overcome this limitation, we analyze the Z-scan experiment using top-hat beams. A graphical method is developed which allows straightforward determination of the nonlinear refraction and absorption coefficients from experimental data. The advantage of using top-hat beams is that it allows Z-scan measurements using a wide variety of laser sources, including dye lasers. Chi(3) values obtained using Z-scan measurements with top-hat and Gaussian beams are compared for the liquid crystal 5CB (4-cyano-4'-n-pentybiphenyl).
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收藏
页码:673 / 675
页数:3
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