INCREASED MICROHARDNESS AND POSITRON-ANNIHILATION IN AL EXPOSED TO A HIGH-POWER ION-BEAM

被引:43
作者
POGREBNJAK, AD
RUZIMOV, SM
机构
关键词
D O I
10.1016/0375-9601(87)90221-0
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
引用
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页码:259 / 261
页数:3
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