ELECTRICAL AND MECHANICAL-PROPERTIES OF METALLIC NANOWIRES - CONDUCTANCE QUANTIZATION AND LOCALIZATION

被引:31
作者
PASCUAL, JI
MENDEZ, J
GOMEZHERRERO, J
BARO, AM
GARCIA, N
LANDMAN, U
LEUDTKE, WD
BOGACHEK, EN
CHENG, HP
机构
[1] CSIC,E-28049 MADRID,SPAIN
[2] GEORGIA INST TECHNOL,SCH PHYS,ATLANTA,GA 30332
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 1995年 / 13卷 / 03期
关键词
D O I
10.1116/1.587838
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Measurements of room-temperature electronic transport in pulled metallic nanowires are presented, demonstrating that the conductance characteristics depend on the length, lateral dimensions, state and degree of disorder, and elongation mechanism of the wire. Conductance during elongation of short wires, l approx. 50 angstrom, exhibits periodic quantization steps with characteristics dips, correlating with the order-disorder states of layers of atoms in the wire, predicted via molecular dynamics simulations. The resistance of longer wires, l ≳ 100 angstrom, exhibits localization characteristics with 1n R(l) approx. l2. Effects of disorder and variations in wire geometry, exhibited via their influence on the transmittivity of the conductance channels and/or the quantization conditions, are demonstrated.
引用
收藏
页码:1280 / 1284
页数:5
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