NEW X-RAY TOPOGRAPHIC TECHNIQUE FOR DETECTION OF SMALL DEFECTS IN HIGHLY PERFECT CRYSTALS

被引：68

作者：

CHIKAWA, JI

ASAEDA, Y

FUJIMOTO, I

机构：

来源：

JOURNAL OF APPLIED PHYSICS | 1970年 / 41卷 / 05期

关键词：

D O I：

10.1063/1.1659142

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

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页码：1922 / &

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