EMPIRICAL FORMULA FOR CALCULATION OF SECONDARY ION YIELDS FROM OXIDIZED METAL-SURFACES AND METAL-OXIDES

被引：132

作者：

PLOG, C ^{[1
]}

WIEDMANN, L ^{[1
]}

BENNINGHOVEN, A ^{[1
]}

机构：

[1] UNIV MUNSTER,INST PHYS,D-4400 MUNSTER,FED REP GER

来源：

SURFACE SCIENCE | 1977年 / 67卷 / 02期

关键词：

D O I：

10.1016/0039-6028(77)90015-2

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

页码：565 / 580

页数：16

共 35 条

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[4] ANALYSIS OF SUBMONOLAYERS ON SILVER BY NEGATIVE SECONDARY ION EMISSION
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[5] INVESTIGATION OF SURFACE-REACTIONS BY STATIC METHOD OF SECONDARY ION MASS-SPECTROMETRY .4. OXIDATION OF MAGNESIUM, STRONTIUM, AND BARIUM IN MONOLAYER RANGE
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[J]. SURFACE SCIENCE, 1974, 41 (02) : 483 - 492
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[7] INVESTIGATION OF SURFACE-REACTIONS BY STATIC METHOD OF SECONDARY ION MASS-SPECTROMETRY .2. OXIDATION OF CHROMIUM IN MONOLAYER RANGE
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[J]. SURFACE SCIENCE, 1973, 39 (02) : 416 - 426
[8] SURFACE INVESTIGATION OF SOLIDS BY STATICAL METHOD OF SECONDARY ION MASS SPECTROSCOPY (SIMS)
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[J]. SURFACE SCIENCE, 1973, 35 (01) : 427 - 457
[9] INVESTIGATION OF SURFACE OXIDATION OF METALS IN SUB-MONOLAYER AND MONOLAYER RANGE WITH STATIC METHOD OF SECONDARY ION MASS-SPECTROMETRY
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[J]. THIN SOLID FILMS, 1972, 12 (02) : 439 - +
[10] MECHANISM OF ION FORMATION AND ION EMISSION DURING SPUTTERING
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[J]. ZEITSCHRIFT FUR PHYSIK, 1969, 220 (02): : 159 - +

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