A SIMPLE PHOTOCONDUCTIVE FREQUENCY-RESOLVED SPECTROMETER FOR CARRIER LIFETIME DETERMINATION IN SEMICONDUCTORS

被引：10

作者：

HOMEWOOD, KP ^{[1
]}

WADE, PG ^{[1
]}

DUNSTAN, DJ ^{[1
]}

机构：

[1] UNIV SURREY,DEPT PHYS,GUILDFORD GU2 5XH,SURREY,ENGLAND

来源：

JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS | 1988年 / 21卷 / 01期

关键词：

D O I：

10.1088/0022-3735/21/1/015

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：84 / 85

页数：2

共 5 条

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DUNSTAN, DJ ;

DEPINNA, SP ;

CAVENETT, BC .

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TSANG, C ;

STREET, RA .

PHYSICAL REVIEW B, 1979, 19 (06) :3027-3040

WAGNER, D ;

IRSIGLER, P ;

DUNSTAN, DJ .

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[5] SYNTHESIS OF SILICON DIOXIDE BY ION-IMPLANTATION [J].

WILSON, IH .