ACOUSTIC MICROSCOPY APPLIED TO SAW DISPERSION AND FILM THICKNESS MEASUREMENT

被引：38

作者：

WEGLEIN, RD

机构：

来源：

IEEE TRANSACTIONS ON SONICS AND ULTRASONICS | 1980年 / 27卷 / 02期

关键词：

D O I：

10.1109/T-SU.1980.31152

中图分类号：

O42 [声学];

学科分类号：

070206 ; 082403 ;

摘要：

引用

页码：82 / 86

页数：5

共 12 条

[1]

Brekhovskikh L., 2012, WAVES LAYERED MEDIA

[2]

BUCARO JA, 1972, J APPL PHYS, V43

[3] MEASUREMENT OF ACOUSTOELASTIC AND 3RD-ORDER ELASTIC-CONSTANTS FOR RAIL STEEL [J].

EGLE, DM ;

BRAY, DE .

JOURNAL OF THE ACOUSTICAL SOCIETY OF AMERICA, 1976, 60 (03) :741-744

[4]

Hickernell F. S., 1978, 1978 Ultrasonics Symposium Proceedings, P60, DOI 10.1109/ULTSYM.1978.197004

[5] ACOUSTIC MICROSCOPY - 1979 [J].

KESSLER, LW ;

YUHAS, DE .

PROCEEDINGS OF THE IEEE, 1979, 67 (04) :526-536

[6] ACOUSTIC MICROSCOPY WITH MECHANICAL SCANNING - REVIEW [J].

QUATE, CF ;

ATALAR, A ;

WICKRAMASINGHE, HK .

PROCEEDINGS OF THE IEEE, 1979, 67 (08) :1092-1114

[7]

SMITH WR, 1972, 1972 P ULTR S, P367

[8] MODEL FOR PREDICTING ACOUSTIC MATERIAL SIGNATURES [J].

WEGLEIN, RD .

APPLIED PHYSICS LETTERS, 1979, 34 (03) :179-181

[9] CHARACTERISTIC MATERIAL SIGNATURES BY ACOUSTIC MICROSCOPY [J].

WEGLEIN, RD ;

WILSON, RG .

ELECTRONICS LETTERS, 1978, 14 (12) :352-354

[10]

WEGLEIN RD, 1977, MAY S REL PHYS LAS V

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