CHARACTERIZATION OF GRAIN-BOUNDARIES OBSERVED IN POLYCRYSTALLINE SILICON FOR SOLAR-CELL APPLICATIONS

被引:10
作者
FONTAINE, C
ROCHER, A
机构
来源
JOURNAL OF MICROSCOPY-OXFORD | 1980年 / 118卷 / JAN期
关键词
D O I
10.1111/j.1365-2818.1980.tb00252.x
中图分类号
TH742 [显微镜];
学科分类号
摘要
引用
收藏
页码:105 / 110
页数:6
相关论文
共 12 条
[1]  
Belouet C., 1978, Thirteenth IEEE Photovoltaic Specialists Conference1978, P131
[2]  
BONNET R, 1978, J MICROSC SPECT ELEC, V3, P77
[3]  
FONTAINE C, 1979, J MICROSC SPECTROSC, V4
[4]  
Friedel G., 1964, LECONS CRISTALLOGRAP
[5]   COINCIDENCE-SITE LATTICES AND COMPLETE PATTERN-SHIFT LATTICES IN CUBIC-CRYSTALS [J].
GRIMMER, H ;
BOLLMANN, W ;
WARRINGTON, DH .
ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES, 1974, A 30 (MAR) :197-207
[6]   GRAIN-BOUNDARY ANALYSIS IN TEM .1. PRACTICAL DETERMINATION OF BICRYSTAL ORIENTATIONS [J].
KARAKOSTAS, T ;
NOUET, G ;
BLERIS, GL ;
HAGEGE, S ;
DELAVIGNETTE, P .
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1978, 50 (02) :703-709
[7]  
KOHN JA, 1958, AM MINERAL, V43, P263
[8]  
REGH J, 1968, ELECTROCHEM TECHNOL, V6, P155
[9]  
ROCHER A, 1978, 9TH INT C EL MICR TO, V1, P426
[10]   ELECTRICAL AND STRUCTURAL CHARACTERIZATION OF SILICON RIBBONS PRODUCED THROUGH CAPILLARY ACTION SHAPING [J].
SCHWUTTKE, GH ;
YANG, K ;
CISZEK, TF .
JOURNAL OF CRYSTAL GROWTH, 1978, 43 (03) :329-335