HIGH SENSITIVITY MOIRE GRID TECHNIQUE FOR STUDYING DEFORMATION IN LARGE OBJECTS

被引：50

作者：

BURCH, JM ^{[1
]}

FORNO, C ^{[1
]}

机构：

[1] NATL PHYS LAB, TEDDINGTON TW11 OLW, MIDDLESEX, ENGLAND

来源：

关键词：

D O I：

10.1117/12.7978755

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

引用

页码：178 / 185

页数：8

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