COMPUTER DIFFERENTIATION OF DC SOFT-X-RAY APPEARANCE POTENTIAL SPECTRA

被引：3

作者：

BAUN, WL

CHAMBERLAIN, MB

SOLOMON, JS

机构：

[1] USAF, MAT LAB, WRIGHT PATTERSON AFB, OH 45433 USA

[2] UNIV DAYTON, RES INST, DAYTON, OH 45409 USA

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 1973年 / 44卷 / 09期

关键词：

D O I：

10.1063/1.1686409

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

收藏

页码：1421 / 1422

页数：2

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[1] X-RAY FILTERING TO IMPROVE SIGNAL-TO-NOISE IN SOFT-X-RAY APPEARANCE POTENTIAL SPECTROSCOPY
BAUN, WL
CHAMBERLAIN, MB
SOLOMON, JS
[J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1973, 44 (09) : 1419 - 1420
[2] CHAMBERLAIN MB, TO BE PUBLISHED
[3] NAGEL DJ, PRIVATE COMMUNICATIO
[4] SOFT X-RAY APPEARANCE POTENTIAL SPECTROMETER FOR ANALYSIS OF SOLID SURFACES
PARK, RL
HOUSTON, JE
SCHREINER, DG
[J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1970, 41 (12) : 1810 - +