DETERMINATION OF RESIDUAL STRESSES IN TITANIUM CARBIDE-BASE CERMETS BY HIGH-TEMPERATURE X-RAY DIFFRACTION

被引：18

作者：

NEWKIRK, HW

SISLER, HH

机构：

来源：

关键词：

D O I：

10.1111/j.1151-2916.1958.tb15449.x

中图分类号：

TQ174 [陶瓷工业]; TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

引用

页码：93 / 103

页数：11

共 45 条

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[12]

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Burger, EE ;

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[16]

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[17] X-ray crystal measurements of nickel at high temperatures [J].

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[18]

JORDAN L, 1930, BS J RES, V5, P1291

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KINGERY, WD .

[20]

KLUG HP, 1954, XRAY DIFFRACTION PRO, P464