RECOMBINATION DYNAMICS IN POROUS SILICON

被引:12
作者
PAVESI, L [1 ]
CESCHINI, M [1 ]
ROMAN, HE [1 ]
机构
[1] UNIV HAMBURG,INST THEORET PHYS,D-20355 HAMBURG,GERMANY
关键词
COMPUTER SIMULATION; LUMINESCENCE; NANOSTRUCTURES; SILICON;
D O I
10.1016/0040-6090(94)05608-G
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The diffusion of photoexcited carriers in porous silicon strongly affects their recombination dynamics. This is evidenced by a detailed study of the room temperature time-resolved photoluminescence of porous silicon samples with various porosities. Monte Carlo simulations of the photoexcited carrier diffusion by the trap-controlled hopping mechanism in a disordered array of silicon quantum dots have been performed to elucidate the interplay between on-site recombinations and diffusion of carriers. The numerical results are in good qualitative agreement with the experimental data.
引用
收藏
页码:67 / 69
页数:3
相关论文
共 14 条
[11]   MULTIPHONON, NON-RADIATIVE TRANSITION RATE FOR ELECTRONS IN SEMICONDUCTORS AND INSULATORS [J].
RIDLEY, BK .
JOURNAL OF PHYSICS C-SOLID STATE PHYSICS, 1978, 11 (11) :2323-2341
[12]  
ROMAN E, UNPUB
[13]   PHOTOLUMINESCENCE MECHANISMS OF POROUS SI OXIDIZED BY DRY OXYGEN [J].
TAKAZAWA, A ;
TAMURA, T ;
YAMADA, M .
JOURNAL OF APPLIED PHYSICS, 1994, 75 (05) :2489-2495
[14]  
VIAL JC, 1993, MAT RES S C, V283, P241, DOI 10.1557/PROC-283-241