LOW-STRESS, COOLABLE SAMPLE MOUNT FOR ULTRAHIGH-VACUUM STUDIES OF FRAGILE SEMICONDUCTORS

被引：9

作者：

SCHULTZ, KA ^{[1
]}

SEEBAUER, EG ^{[1
]}

机构：

[1] UNIV ILLINOIS,DEPT CHEM ENGN,URBANA,IL 61801

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 1992年 / 63卷 / 01期

关键词：

D O I：

10.1063/1.1142960

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

A sample mount is described that is particularly useful for cooling and uniformly heating thin, fragile semiconductor samples in ultrahigh vacuum while maintaining optical flatness. The design is based on spring-loaded clips and permits rapid sample exchange. Difficulties with certain conventional methods of temperature measurement are avoided.

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收藏

页码：218 / 219

页数：2

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