AN EXAFS STUDY OF THE LOCAL-STRUCTURE OF CE-SI-O AMORPHOUS THIN-FILMS

被引：5

作者：

SINGH, A

GURMAN, SJ

DAVIS, EA

机构：

来源：

关键词：

D O I：

10.1016/0022-3093(89)90265-2

中图分类号：

TQ174 [陶瓷工业]; TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

引用

页码：249 / 257

页数：9

共 17 条

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[9] HOGARTH CA, 1968, P INT C PHYS SEMICON, V2, P1274
[10] SOME APPLICATIONS OF STATISTICAL TESTS IN ANALYSIS OF EXAFS AND SEXAFS DATA
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