ELECTRICAL-CONDUCTION AND OBSERVATION OF LOCAL DEFECTS IN THIN SANDWICH STRUCTURES OF CU-SIO/CEO2-CU

被引：24

作者：

ALDHHAN, ZT

HOGARTH, CA

机构：

[1] Brunel Univ, Uxbridge, Engl, Brunel Univ, Uxbridge, Engl

来源：

INTERNATIONAL JOURNAL OF ELECTRONICS | 1987年 / 63卷 / 05期

关键词：

ELECTRIC CONDUCTIVITY - Measurements - FILMS - Dielectric - MICROSCOPIC EXAMINATION - Scanning Electron Microscopy - OXIDES - Thin Films - SOLID STATE DEVICES; MIM; -; Electroforming;

D O I：

10.1080/00207218708939176

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

AC and DC conduction in MIM sandwich structures based on SiO/CeO//2 as a dielectric prepared by the co-evaporation technique has been investigated before and after electroforming for different compositions. The electroformed samples show voltage-controlled negative resistance (VCNR), voltage-memory, thermal-voltage-memory and pressure-voltage-memory effects and the results are explained in terms of the filamentary model of electrical conduction. The positive electrode was investigated using a scanning electron microscope to observe the effects of electroforming and the liberation of gas as a result of the application of high electric fields.

引用

页码：707 / 722

页数：16

共 14 条

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