OBSERVATIONS OF LOCAL DEFECTS CAUSED BY ELECTRICAL-CONDUCTION THROUGH THIN SANDWICH STRUCTURES OF AG-SIO - BAO-AG

被引:35
作者
RAKHSHANI, AE [1 ]
HOGARTH, CA [1 ]
ABIDI, AA [1 ]
机构
[1] BRUNEL UNIV,DEPT PHYS,KINGSTON LANE,UXBRIDGE,MIDDLESEX,ENGLAND
关键词
D O I
10.1016/0022-3093(76)90106-X
中图分类号
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
引用
收藏
页码:25 / 42
页数:18
相关论文
共 22 条
[1]   ELECTRON-EMISSION AND RELATED PROPERTIES OF AMORPHOUS THIN-FILMS OF MIXED BARIUM AND SILICON OXIDES [J].
ABIDI, A ;
HOGARTH, CA .
THIN SOLID FILMS, 1974, 22 (02) :203-214
[2]  
ABIDI AA, 1974, THESIS BRUNEL U
[3]   STUDY OF DC ELECTRICAL PROPERTIES OF THIN-FILMS OF CO-EVAPORATED DIELECTRIC SYSTEM SIO-TIO [J].
BIDADI, H ;
HOGARTH, CA .
THIN SOLID FILMS, 1975, 27 (02) :319-327
[4]   SOME ELECTRICAL PROPERTIES OF THIN-FILM COPPER-BOROSILICATE GLASS-COPPER SANDWICHES INTENDED FOR USE AS ELECTRON EMITTERS [J].
BIDADI, H ;
HOGARTH, CA .
INTERNATIONAL JOURNAL OF ELECTRONICS, 1974, 36 (03) :287-299
[5]  
BIDADI H, 1974, THESIS BRUNEL U
[6]   BREAKDOWN CONDUCTION IN AL-SIO-AL CAPACITORS [J].
BUDENSTEIN, PP ;
HAYES, PJ .
JOURNAL OF APPLIED PHYSICS, 1967, 38 (07) :2837-+
[7]   ELECTROFORMING OF MIM THIN-FILM DEVICES IN AIR AT ATMOSPHERIC PRESSURE [J].
COLLINS, RA ;
BOWMAN, G ;
SUTHERLAND, RR .
JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1971, 4 (11) :L49-+
[8]  
DEARNALEY G, 1970, REP PROGR PHYS, V33, P429
[9]   CONDUCTING FILAMENTS AND VOLTAGE-CONTROLLED NEGATIVE-RESISTANCE IN AL-AL2-O3-AU STRUCTURES WITH AMORPHOUS DIELECTRIC [J].
EMMER, I .
THIN SOLID FILMS, 1974, 20 (01) :43-52
[10]   NOVEL CONDUCTION PHENOMENA IN THIN-FILM BOROSILICATE SPECIMENS [J].
HOGARTH, CA ;
TAHERI, EHZ .
THIN SOLID FILMS, 1972, 10 (03) :455-&