OBSERVATIONS OF LOCAL DEFECTS CAUSED BY ELECTRICAL-CONDUCTION THROUGH THIN SANDWICH STRUCTURES OF AG-SIO - BAO-AG

被引:35
作者
RAKHSHANI, AE [1 ]
HOGARTH, CA [1 ]
ABIDI, AA [1 ]
机构
[1] BRUNEL UNIV,DEPT PHYS,KINGSTON LANE,UXBRIDGE,MIDDLESEX,ENGLAND
关键词
D O I
10.1016/0022-3093(76)90106-X
中图分类号
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
引用
收藏
页码:25 / 42
页数:18
相关论文
共 22 条
[11]  
HOGARTH CA, 1972, THIN SOLID FILMS, V13, P327
[12]  
HOGARTH CA, 1968, P INT C PHYS SEMICON, P1274
[13]  
Park K. C., 1970, Journal of Non-Crystalline Solids, V2, P284, DOI 10.1016/0022-3093(70)90145-6
[14]  
RALPH JE, 1972, J NONCRYST SOLIDS, V7, P236
[15]   DIFFUSION OF BARIUM IN BARIUM OXIDE [J].
REDINGTON, RW .
PHYSICAL REVIEW, 1952, 87 (06) :1066-1073
[16]   DETECTION OF CURRENT FILAMENTS IN THIN AMORPHOUS FILMS [J].
SCHWARTZ, RJ ;
LUGINBUH.HW .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1972, 9 (01) :65-&
[17]  
SIE CH, 1972, 5TH P ANN SCANN EL 1, P193
[18]   ELECTRICAL FORMING IN AND ELECTRON-EMISSION FROM THIN-FILM ALUMINUM-BOROSILICATE GLASS-ALUMUNUM SANDWICHES [J].
TAHERI, EHZ ;
GOULD, RD ;
HOGARTH, CA .
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1972, 12 (02) :563-&
[19]   OBSERVATIONS OF BEHAVIOR OF SOME THIN-FILM CATHODES IN SCANNING ELECTRON-MICROSCOPE [J].
TAHERI, EHZ ;
HOGARTH, CA .
JOURNAL OF NON-CRYSTALLINE SOLIDS, 1974, 15 (03) :386-394
[20]  
Tanaka K., 1973, Journal of Non-Crystalline Solids, V12, P100, DOI 10.1016/0022-3093(73)90057-4