DETECTION OF CURRENT FILAMENTS IN THIN AMORPHOUS FILMS

被引：2

作者：

SCHWARTZ, RJ

LUGINBUH.HW

机构：

来源：

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY | 1972年 / 9卷 / 01期

关键词：

D O I：

10.1116/1.1316688

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：65 / &

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[10] CHARACTERISTICS OF SEMICONDUCTING GLASS SWITCHING/MEMORY DIODES [J].

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