RHEED OBSERVATION OF THE SI(111)(SQUARE-ROOT-31XSQUARE-ROOT-31)R+ -9-DEGREES-IN STRUCTURE

被引:32
作者
AIYAMA, T
INO, S
机构
关键词
D O I
10.1016/0039-6028(79)90214-0
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
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页码:L585 / L588
页数:4
相关论文
共 7 条
[1]   LEED STUDIES OF (0001) FACE OF ALPHA-ALUMINA [J].
CHANG, CC .
JOURNAL OF APPLIED PHYSICS, 1968, 39 (12) :5570-&
[2]  
CHANG CC, 1969, 4TH P INT MAT S BERK, P77
[3]   LOW-ENERGY ELECTRON DIFFRACTION OBSERVATIONS OF ALPHA-ALUMINA [J].
CHARIG, JM .
APPLIED PHYSICS LETTERS, 1967, 10 (05) :139-&
[4]  
CHARIG JM, 1969, 4TH P INT MAT S BERK, P34
[5]   SOME NEW TECHNIQUES IN REFLECTION HIGH-ENERGY ELECTRON-DIFFRACTION (RHEED) APPLICATION TO SURFACE-STRUCTURE STUDIES [J].
INO, S .
JAPANESE JOURNAL OF APPLIED PHYSICS, 1977, 16 (06) :891-908
[6]   SURFACE REACTIONS OF SILICON (3) WITH ALUMINUM AND INDIUM [J].
LANDER, JJ ;
MORRISON, J .
JOURNAL OF APPLIED PHYSICS, 1965, 36 (05) :1706-&
[7]   SURFACE REACTIONS OF SILICON WITH ALUMINUM AND WITH INDIUM [J].
LANDER, JJ ;
MORRISON, J .
SURFACE SCIENCE, 1964, 2 :553-565