NEUTRON DAMAGE IN GE(HP) COAXIAL DETECTORS

被引：14

作者：

DARKEN, LS ^{[1
]}

TRAMMELL, RC ^{[1
]}

RAUDORF, TW ^{[1
]}

PEHL, RH ^{[1
]}

机构：

[1] EG&G ORTEC,100 MIDLAND RD,OAK RIDGE,TN 37830

来源：

关键词：

D O I：

10.1109/TNS.1981.4331241

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：572 / 578

页数：7

共 11 条

[1] ABAKUMOV VN, 1978, SOV PHYS SEMICOND+, V12, P1
[2] CLELAND JW, 1964, RAD DAMAGE SEMICONDU, P401
[3] CLELAND JW, 1960, P INT C SEM PHYS PRA, P299
[4] MECHANISM FOR FAST-NEUTRON DAMAGE OF GE(HP) DETECTORS
DARKEN, LS
TRAMMELL, RC
RAUDORF, TW
PEHL, RH
ELLIOTT, JH
[J]. NUCLEAR INSTRUMENTS & METHODS, 1980, 171 (01): : 49 - 59
[5] DEFECT CLUSTERS AND SIMPLE DEFECT BUILDUP KINETICS IN FAST-NEUTRON IRRADIATED N-SI
DOLGOLENKO, AP
FISHCHUK, II
[J]. PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1978, 50 (02): : 751 - 755
[6] GOULDING FS, 1969, SEMICONDUCTOR NUCLEA
[7] KONOPLEV.RF, 1974, SOV PHYS SEMICOND+, V7, P906
[8] FAST-NEUTRON DAMAGE IN GERMANIUM DETECTORS
KRANER, HW
[J]. IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1980, 27 (01) : 218 - 234
[9] FAST-NEUTRON RADIATION-DAMAGE OF HIGH-PURITY GERMANIUM DETECTORS
KRANER, HW
PEHL, RH
HALLER, EE
[J]. IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1975, NS22 (01) : 149 - 159
[10] CAPACITANCE TRANSIENT SPECTROSCOPY
MILLER, GL
LANG, DV
KIMERLING, LC
[J]. ANNUAL REVIEW OF MATERIALS SCIENCE, 1977, 7 : 377 - 448