OBSERVATION OF ELECTRIC-FIELD GRADIENTS NEAR FIELD-EMISSION CATHODE ARRAYS

被引：19

作者：

LIANG, Y

BONNELL, DA

GOODHUE, WD

RATHMAN, DD

BOZLER, CO

机构：

[1] UNIV PENN,DEPT MAT SCI & ENGN,PHILADELPHIA,PA 19104

[2] MIT,LINCOLN LAB,LEXINGTON,MA 02173

来源：

APPLIED PHYSICS LETTERS | 1995年 / 66卷 / 09期

关键词：

D O I：

10.1063/1.113841

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

The variation of electric field gradient above arrays of field emission cathodes has been investigated using atomic force microscopy. The spatial distribution of electric field gradient was obtained as a function of bias and height. Results show a parabolic relationship between the sample bias and electric field gradient. Furthermore, the height dependence of the field gradient is found to follow a power law relationship. These new results demonstrate that force-gradient atomic force microscopy is capable of providing a direct visual presentation of the variation of field gradients above submicron-periodicity field emitter arrays.© 1995 American Institute of Physics.

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页码：1147 / 1149

页数：3

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