ANALYTICAL DETERMINATION OF OUTPUT RESISTANCE AND DC MATCHING ERRORS IN MOS CURRENT MIRRORS

被引：22

作者：

WANG, Z

机构：

[1] Swiss Federal Inst of Technology, Zurich

来源：

IEE PROCEEDINGS-G CIRCUITS DEVICES AND SYSTEMS | 1990年 / 137卷 / 05期

关键词：

D O I：

10.1049/ip-g-2.1990.0061

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

A new technique for the analytical determination of output resistance and current ratio or DC matching errors in MOS current mirrors is presented, emphasising, in comparison four types of frequently used circuit: the simple current mirror, the Wilson current mirror, the improved Wilson current mirror and the cascode current mirror. Formulas that precisely describe the performance parameters are derived. The minimum output voltage is also discussed. A review of other types of current mirror configurations is included.

引用

收藏

页码：397 / 404

页数：8

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