AN X-RAY DEVICE FOR CONTINUOUS TRACKING OF MOVING INTERFACES IN CRYSTALLINE SOLIDS

被引：41

作者：

CZUBAYKO, U ^{[1
]}

MOLODOV, D ^{[1
]}

PETERSEN, BC ^{[1
]}

GOTTSTEIN, G ^{[1
]}

SHVINDLERMAN, LS ^{[1
]}

机构：

[1] RUSSIAN ACAD SCI, INST SOLID STATE PHYS, CHERNOGOLOVKA 142432, RUSSIA

来源：

MEASUREMENT SCIENCE AND TECHNOLOGY | 1995年 / 6卷 / 07期

关键词：

Crystal orientation - Crystal structure - Crystalline materials - Grain boundaries - Interfaces (materials) - Position measurement - Solids - Velocity measurement - X ray diffraction;

D O I：

10.1088/0957-0233/6/7/014

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

An x-ray interface continuous tracking device was developed, which enables continuous tracking of interface motion in crystalline solids. The device utilizes x-ray diffraction rather than optical methods to determine a boundary position and allows one to determine the velocity of migration at any moment of the experiment. The device was particularly designed to investigate grain boundary migration. The measurable velocity ranges from 1 to 1000 mu m s(-1) with a temporal resolution of about five measurements per second.

引用

页码：947 / 952

页数：6

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