INVESTIGATION OF THIN OXIDE FE-57 FILMS BY MOSSBAUER TOTAL EXTERNAL REFLECTION

被引：20

作者：

ANDREEVA, MA

BELOZERSKII, GN

IRKAEV, SM

SEMENOV, VG

SOKOLOV, AY

SHUMILOVA, NV

机构：

[1] LENINGRAD STATE UNIV,DEPT GEOG,SU-199164 LENINGRAD,USSR

[2] ACAD SCI USSR,INST ANALYT INSTRUMENTAT,SU-198103 LENINGRAD,USSR

来源：

PHYSICA STATUS SOLIDI A-APPLIED RESEARCH | 1991年 / 127卷 / 02期

关键词：

Crystallography - Mathematical Models - Crystals - Spectroscopic Analysis - Spectroscopy; Mossbauer;

D O I：

10.1002/pssa.2211270221

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Depth selectivity of Mossbauer total external reflection (TER) is demonstrated. A series of CEMS spectra at different glancing angles of an evaporated 20 nm Fe-57 film on glass substrate are obtained. A theory of propagation of the radiation in the multilayer medium under TER conditions is used for the interpretation of the results taking into account multiple reflections in each layer. The computer fit gives the three step depth profiles of the distribution of different hyperfine interactions in the film.

引用

页码：455 / 464

页数：10

共 9 条

[1]

ANDREEVA MA, 1983, ZH TEKH FIZ+, V53, P1395

[2]

ANDREEVA MA, 1987, ZH TEKH FIZ+, V57, P2009

[3]

ANDREEVA MA, 1984, OPT SPEKTROSK+, V56, P546

[4]

ANDREEVA MA, 1986, IZV AN SSSR FIZ+, V50, P2378