EXAFS AT GRAZING-INCIDENCE - DATA-COLLECTION AND ANALYSIS

Extended x-ray absorption fine structure (EXAFS) at grazing incidence can be applied to a large variety of surface and interface problems. This paper discusses in detail the collection and analysis of such data using interface EXAFS from metal/Al bilayers as an example. A comparison of the fluorescence and reflectivity detection channels is given, along with a discussion of the methods for correction of anomalous dispersion distortions. In addition, data from a Ni-Ti multilayer is used to demonstrate the potential of enhancing the sensitivity of the EXAFS signal to selected regions using standing wave effects.