GLANCING ANGLE EXAFS STUDIES OF CU-AL THIN-FILM INTERFACES

被引:4
作者
CHEN, H
HEALD, SM
机构
来源
PHYSICA B | 1989年 / 158卷 / 1-3期
关键词
D O I
10.1016/0921-4526(89)90427-4
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
引用
收藏
页码:658 / 659
页数:2
相关论文
共 4 条
[1]  
CHEN H, 1986, P MAT RES SOC
[2]  
CHEN H, IN PRESS IONIC SOLID
[3]   A STUDY OF THE INITIAL GROWTH-KINETICS OF THE COPPER-ALUMINUM THIN-FILM INTERFACE REACTION BY INSITU X-RAY-DIFFRACTION AND RUTHERFORD BACKSCATTERING ANALYSIS [J].
HAMM, RA ;
VANDENBERG, JM .
JOURNAL OF APPLIED PHYSICS, 1984, 56 (02) :293-299
[4]   GLANCING-ANGLE EXTENDED X-RAY-ABSORPTION FINE-STRUCTURE AND REFLECTIVITY STUDIES OF INTERFACIAL REGIONS [J].
HEALD, SM ;
CHEN, H ;
TRANQUADA, JM .
PHYSICAL REVIEW B, 1988, 38 (02) :1016-1026