GLANCING-ANGLE EXTENDED X-RAY-ABSORPTION FINE-STRUCTURE AND REFLECTIVITY STUDIES OF INTERFACIAL REGIONS

[1] X-RAY PHOTOABSORPTION OF SOLIDS BY SPECULAR REFLECTION [J]. JOURNAL OF PHYSICS C-SOLID STATE PHYSICS, 1978, 11 (21): : 4439 - 4445

[2] Bonse U., 1983, EXAFS and Near Edge Structures. Proceedings of the International Conference, P376

[3] BOSIO L, 1984, J ELECTROANAL CHEM, V180, P265, DOI 10.1016/0368-1874(84)83585-6

[4] Church E. L., 1979, P SOC PHOTO-OPT INS, V184, P196

[5] ANOMALOUS DISPERSION CALCULATIONS NEAR TO AND ON THE LONG-WAVELENGTH SIDE OF AN ABSORPTION-EDGE [J]. ACTA CRYSTALLOGRAPHICA SECTION A, 1981, 37 (MAR): : 267 - 268

[6] CALCULATION OF ANOMALOUS SCATTERING FACTORS AT ARBITRARY WAVELENGTHS [J]. JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1983, 16 (AUG) : 437 - 437

[7] Dreier P., 1983, EXAFS and Near Edge Structures. Proceedings of the International Conference, P378

[8] VECTOR SCATTERING THEORY [J]. OPTICAL ENGINEERING, 1979, 18 (02) : 116 - 124

[9] EXAFS AND SURFACE EXAFS FROM MEASUREMENTS OF X-RAY REFLECTIVITY [J]. JOURNAL OF PHYSICS C-SOLID STATE PHYSICS, 1980, 13 (11): : L249 - L253

[10] A STUDY OF THE INITIAL GROWTH-KINETICS OF THE COPPER-ALUMINUM THIN-FILM INTERFACE REACTION BY INSITU X-RAY-DIFFRACTION AND RUTHERFORD BACKSCATTERING ANALYSIS [J]. JOURNAL OF APPLIED PHYSICS, 1984, 56 (02) : 293 - 299

[1] X-RAY PHOTOABSORPTION OF SOLIDS BY SPECULAR REFLECTION [J]. JOURNAL OF PHYSICS C-SOLID STATE PHYSICS, 1978, 11 (21): : 4439 - 4445

[2] Bonse U., 1983, EXAFS and Near Edge Structures. Proceedings of the International Conference, P376

[3] BOSIO L, 1984, J ELECTROANAL CHEM, V180, P265, DOI 10.1016/0368-1874(84)83585-6

[4] Church E. L., 1979, P SOC PHOTO-OPT INS, V184, P196

[5] ANOMALOUS DISPERSION CALCULATIONS NEAR TO AND ON THE LONG-WAVELENGTH SIDE OF AN ABSORPTION-EDGE [J]. ACTA CRYSTALLOGRAPHICA SECTION A, 1981, 37 (MAR): : 267 - 268

[6] CALCULATION OF ANOMALOUS SCATTERING FACTORS AT ARBITRARY WAVELENGTHS [J]. JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1983, 16 (AUG) : 437 - 437

[7] Dreier P., 1983, EXAFS and Near Edge Structures. Proceedings of the International Conference, P378

[8] VECTOR SCATTERING THEORY [J]. OPTICAL ENGINEERING, 1979, 18 (02) : 116 - 124

[9] EXAFS AND SURFACE EXAFS FROM MEASUREMENTS OF X-RAY REFLECTIVITY [J]. JOURNAL OF PHYSICS C-SOLID STATE PHYSICS, 1980, 13 (11): : L249 - L253

[10] A STUDY OF THE INITIAL GROWTH-KINETICS OF THE COPPER-ALUMINUM THIN-FILM INTERFACE REACTION BY INSITU X-RAY-DIFFRACTION AND RUTHERFORD BACKSCATTERING ANALYSIS [J]. JOURNAL OF APPLIED PHYSICS, 1984, 56 (02) : 293 - 299