A COMBINED TEM APFIM APPROACH TO THE STUDY OF PHASE-TRANSFORMATIONS - PHASE IDENTIFICATION IN THE FE-BE SYSTEM

被引：4

作者：

BURKE, MG ^{[1
]}

MILLER, MK ^{[1
]}

机构：

[1] OAK RIDGE NATL LAB,DIV MET & CERAM,OAK RIDGE,TN 37831

来源：

ULTRAMICROSCOPY | 1989年 / 30卷 / 1-2期

关键词：

D O I：

10.1016/0304-3991(89)90188-5

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：199 / 209

页数：11

共 14 条

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MILLER MK, 1984, SCRIPTA METALL MATER, V18, P111, DOI 10.1016/0036-9748(84)90100-5

[8] IDENTIFICATION OF AN ORDERED HEXAGONAL BEFE PHASE [J].

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[9] MEASUREMENT OF CHARACTERISTIC WAVELENGTHS IN MODULATED MICROSTRUCTURES BY FIELD-ION MICROSCOPY [J].

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[10]

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