SUPPRESSION OF MOBILE ION RELATED INSTABILITY IN MO-GATE MOS STRUCTURES

被引:8
作者
NOZAKI, T
OKABAYASHI, H
机构
关键词
D O I
10.1149/1.2127362
中图分类号
O646 [电化学、电解、磁化学];
学科分类号
081704 ;
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页码:175 / 179
页数:5
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