COMPOSITIONALLY DEPENDENT SI 2P BINDING-ENERGY SHIFTS IN SILICON OXYNITRIDE THIN-FILMS

被引：37

作者：

BROW, RK ^{[1
]}

PANTANO, CG ^{[1
]}

机构：

[1] PENN STATE UNIV,DEPT MAT SCI & ENGN,UNIVERSITY PK,PA 16801

来源：

JOURNAL OF THE AMERICAN CERAMIC SOCIETY | 1986年 / 69卷 / 04期

关键词：

D O I：

10.1111/j.1151-2916.1986.tb04738.x

中图分类号：

TQ174 [陶瓷工业]; TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

引用

页码：314 / 316

页数：3

共 18 条

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[10] SOME THOUGHTS CONCERNING CALCULATION OF BOND IONICITY AND CHARGE ON AN ATOM [J].

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JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1975, 6 (03) :253-258

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