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BREWSTER AND PSEUDO-BREWSTER ANGLES OF UNIAXIAL CRYSTAL-SURFACES AND THEIR USE FOR DETERMINATION OF OPTICAL-PROPERTIES
被引:31
作者
:
ELSHAZLYZAGHLOUL, M
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV NEW ORLEANS,DEPT ELECT ENGN,NEW ORLEANS,LA 70122
UNIV NEW ORLEANS,DEPT ELECT ENGN,NEW ORLEANS,LA 70122
ELSHAZLYZAGHLOUL, M
[
1
]
AZZAM, RMA
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV NEW ORLEANS,DEPT ELECT ENGN,NEW ORLEANS,LA 70122
UNIV NEW ORLEANS,DEPT ELECT ENGN,NEW ORLEANS,LA 70122
AZZAM, RMA
[
1
]
机构
:
[1]
UNIV NEW ORLEANS,DEPT ELECT ENGN,NEW ORLEANS,LA 70122
来源
:
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA
|
1982年
/ 72卷
/ 05期
关键词
:
D O I
:
10.1364/JOSA.72.000657
中图分类号
:
O4 [物理学];
学科分类号
:
0702 ;
摘要
:
引用
收藏
页码:657 / 661
页数:5
相关论文
共 6 条
[1]
Azzam RMA, 1977, ELLIPSOMETRY POLARIZ
[2]
Bennett JM, 1978, HDB OPTICS
[3]
BORN M, 1975, PRINCIPLES OPTICS, P43
[4]
ELLIPSOMETRIC DETERMINATION OF OPTICAL ANISOTROPY OF GALLIUM SELENIDE
MEYER, F
论文数:
0
引用数:
0
h-index:
0
机构:
NV PHILIPS GLOEILAMPENFABRIEKEN,RES LABS,EINDHOVEN,NETHERLANDS
NV PHILIPS GLOEILAMPENFABRIEKEN,RES LABS,EINDHOVEN,NETHERLANDS
MEYER, F
KLUIZENA.EE
论文数:
0
引用数:
0
h-index:
0
机构:
NV PHILIPS GLOEILAMPENFABRIEKEN,RES LABS,EINDHOVEN,NETHERLANDS
NV PHILIPS GLOEILAMPENFABRIEKEN,RES LABS,EINDHOVEN,NETHERLANDS
KLUIZENA.EE
ENGELSEN, DD
论文数:
0
引用数:
0
h-index:
0
机构:
NV PHILIPS GLOEILAMPENFABRIEKEN,RES LABS,EINDHOVEN,NETHERLANDS
NV PHILIPS GLOEILAMPENFABRIEKEN,RES LABS,EINDHOVEN,NETHERLANDS
ENGELSEN, DD
[J].
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA,
1973,
63
(05)
: 529
-
532
[5]
DEFINITIONS AND CONVENTIONS IN ELLIPSOMETRY
MULLER, RH
论文数:
0
引用数:
0
h-index:
0
机构:
Inorganic Materials Research Division, Lawrence Radiation Laboratory, University of California, Berkeley
MULLER, RH
[J].
SURFACE SCIENCE,
1969,
16
: 14
-
&
[6]
Sosnowski T.P., 1972, OPT COMMUN, V4, P408, DOI [10.1016/0030-4018(72)90112-5, DOI 10.1016/0030-4018(72)90112-5]
←
1
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共 6 条
[1]
Azzam RMA, 1977, ELLIPSOMETRY POLARIZ
[2]
Bennett JM, 1978, HDB OPTICS
[3]
BORN M, 1975, PRINCIPLES OPTICS, P43
[4]
ELLIPSOMETRIC DETERMINATION OF OPTICAL ANISOTROPY OF GALLIUM SELENIDE
MEYER, F
论文数:
0
引用数:
0
h-index:
0
机构:
NV PHILIPS GLOEILAMPENFABRIEKEN,RES LABS,EINDHOVEN,NETHERLANDS
NV PHILIPS GLOEILAMPENFABRIEKEN,RES LABS,EINDHOVEN,NETHERLANDS
MEYER, F
KLUIZENA.EE
论文数:
0
引用数:
0
h-index:
0
机构:
NV PHILIPS GLOEILAMPENFABRIEKEN,RES LABS,EINDHOVEN,NETHERLANDS
NV PHILIPS GLOEILAMPENFABRIEKEN,RES LABS,EINDHOVEN,NETHERLANDS
KLUIZENA.EE
ENGELSEN, DD
论文数:
0
引用数:
0
h-index:
0
机构:
NV PHILIPS GLOEILAMPENFABRIEKEN,RES LABS,EINDHOVEN,NETHERLANDS
NV PHILIPS GLOEILAMPENFABRIEKEN,RES LABS,EINDHOVEN,NETHERLANDS
ENGELSEN, DD
[J].
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA,
1973,
63
(05)
: 529
-
532
[5]
DEFINITIONS AND CONVENTIONS IN ELLIPSOMETRY
MULLER, RH
论文数:
0
引用数:
0
h-index:
0
机构:
Inorganic Materials Research Division, Lawrence Radiation Laboratory, University of California, Berkeley
MULLER, RH
[J].
SURFACE SCIENCE,
1969,
16
: 14
-
&
[6]
Sosnowski T.P., 1972, OPT COMMUN, V4, P408, DOI [10.1016/0030-4018(72)90112-5, DOI 10.1016/0030-4018(72)90112-5]
←
1
→