LOW-TEMPERATURE SCANNING ELECTRON-MICROSCOPY STUDIES OF SUPERCONDUCTING THIN-FILMS AND JOSEPHSON-JUNCTIONS

被引：24

作者：

GROSS, R

DODERER, T

HUEBENER, RP

KOBER, F

KOELLE, D

KRUELLE, C

MANNHART, J

MAYER, B

QUENTER, D

USTINOV, A

机构：

[1] IBM CORP,DIV RES,CH-8803 RUSCHLIKON,SWITZERLAND

[2] ACAD SCI USSR,INST SOLID STATE PHYS,CHERNOGOLOVKA 142432,USSR

来源：

PHYSICA B | 1991年 / 169卷 / 1-4期

关键词：

D O I：

10.1016/0921-4526(91)90261-C

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

Scanning techniques represent powerful methods for the characterization of condensed matter. Extending Scanning Electron Microscopy (SEM) to the range of low temperatures an interesting tool for studying low-temperature properties of solids with high-spatial and temporal resolution is obtained. By Low-Temperature Scanning Electron Microscopy (LTSEM) important new information on low-temperature phenomena in superconductors, semiconductors, and insulators is obtained by two-dimensional imaging. Here, we summarize the basic principles of LTSEM and show its application to the study of superconducting films and Josephson junctions.

引用

页码：415 / 421

页数：7

共 41 条

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