DEPOSITION OF SILICON-OXIDE ONTO POLYETHYLENE AND POLYETHYLENETEREPHTHALATE - AN X-RAY PHOTOELECTRON-SPECTROSCOPY INTERFACIAL STUDY

被引：22

作者：

ROTGER, JC ^{[1
]}

PIREAUX, JJ ^{[1
]}

CAUDANO, R ^{[1
]}

THORNE, NA ^{[1
]}

DUNLOP, HM ^{[1
]}

BENMALEK, M ^{[1
]}

机构：

[1] CTR ALP, PECHINEY CTR RECH VOREPPE, F-38340 VOREPPE, FRANCE

来源：

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A | 1995年 / 13卷 / 02期

关键词：

D O I：

10.1116/1.579408

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

引用

页码：260 / 267

页数：8

共 28 条

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SHI MK, 1991, THESIS U L PASTEUR S

[27] XPS STUDY OF AL POLYETHYLENE TEREPHTALATE INTERFACE [J].

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[28]

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