ELASTIC AND INELASTIC-SCATTERING EFFECTS IN REFLECTION ELECTRON-MICROSCOPY

被引：29

作者：

BLELOCH, AL

HOWIE, A

MILNE, RH

WALLS, MG

机构：

来源：

ULTRAMICROSCOPY | 1989年 / 29卷 / 1-4期

关键词：

D O I：

10.1016/0304-3991(89)90244-1

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：175 / 182

页数：8

共 33 条

[1]

BETHGE H, 1967, I PHYS C SER, V1, P17

[2]

BIRD DM, 1988, I PHYS C SER, V90, P119

[3]

BLELOCH AL, 1988, P NATO ARW RHEED REF

[4] THE IMAGE-CONTRAST OF SURFACE STEPS IN REFLECTION ELECTRON-MICROSCOPY [J].

COWLEY, JM ;

PENG, L .

ULTRAMICROSCOPY, 1985, 16 (01) :59-67

[5]

HOJLUNDNIELSEN PE, 1976, SURF SCI, V54, P340

[6] SURFACE-REACTIONS AND EXCITATIONS [J].

HOWIE, A .

ULTRAMICROSCOPY, 1983, 11 (2-3) :141-148

[7]

HOWIE A, 1985, I PHYS C SER, V78, P117

[8] EXPERIMENTAL STUDIES OF ATOMIC STEP CONTRAST IN REFLECTION ELECTRON-MICROSCOPY (REM) [J].

HSU, T ;

PENG, LM .

ULTRAMICROSCOPY, 1987, 22 (1-4) :217-224

[9] REFLECTION ELECTRON-MICROSCOPY (REM) OF FCC METALS [J].

HSU, T ;

COWLEY, JM .

ULTRAMICROSCOPY, 1983, 11 (04) :239-250

[10] ABSORPTION PARAMETERS IN ELECTRON DIFFRACTION THEORY [J].

HUMPHREYS, CJ ;

HIRSCH, PB .

PHILOSOPHICAL MAGAZINE, 1968, 18 (151) :115-+

← 1 2 3 4 →