USE OF SURFACE-PLASMON EXCITATION FOR DETERMINATION OF THE THICKNESS AND OPTICAL-CONSTANTS OF VERY THIN SURFACE-LAYERS

被引：31

作者：

LOPEZRIOS, T

VUYE, G

机构：

[1] Laboratoire d'Optique, Solides Equipe, Recherche Associée au CNRS No. 462., F-75230 Paris Cedex 05

来源：

SURFACE SCIENCE | 1979年 / 81卷 / 02期

关键词：

D O I：

10.1016/0039-6028(79)90118-3

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

We present a method using attenuated total reflection (ATR) with excitation of surface plasma waves at different wavelengths and angles of incidence, which allows an accurate determination of the thickness and optical constants of absorbing surface layers from optical measurements only. This method is applied to the case of very thin Au surface layers on (111)Ag, and the results are discussed. © 1979.

引用

页码：529 / 538

页数：10

共 22 条

[1] OPTICAL-PROPERTIES OF VERY THIN-FILMS [J].