REFLECTANCE AND ELLIPSOMETRY WHEN SUBMICROSCOPIC PARTICLES BESTREW A SURFACE

被引：39

作者：

BERREMAN, DW

机构：

来源：

JOURNAL OF THE OPTICAL SOCIETY OF AMERICA | 1970年 / 60卷 / 04期

关键词：

D O I：

10.1364/JOSA.60.000499

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

引用

页码：499 / +

页数：1

共 17 条

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