APPLICATIONS OF A GLAZING INCIDENCE X-RAY-FLUORESCENCE ANALYSIS TO FORENSIC SAMPLES

被引:24
作者
NINOMIYA, T
NOMURA, S
TANIGUCHI, K
IKEDA, S
机构
[1] OSAKA ELECTROCOMMUN UNIV,JR COLL,NEYAGAWA,OSAKA 572,JAPAN
[2] OSAKA ELECTROCOMMUN UNIV,FAC ENGN,NEYAGAWA,OSAKA 572,JAPAN
[3] RYUKOKU UNIV,FAC SCI & TECHNOL,OTSU,SHIGA 52021,JAPAN
关键词
GLAZING INCIDENCE X-RAY FLUORESCENCE ANALYSIS; TOTAL REFLECTION X-RAY FLUORESCENCE ANALYSIS; FINE BEAM X-RAY FLUORESCENCE ANALYSIS; TRACE ANALYSIS; ENERGY DISPERSIVE XRF; CRIME INVESTIGATION; FORENSIC SAMPLE; COUNTERFEIT BILL; VINYL TAPE; SEMEN; DRUG; FINGERPRINT; GUNSHOT RESIDUE; BRANDY;
D O I
10.2116/analsci.11.489
中图分类号
O65 [分析化学];
学科分类号
070302 ; 081704 ;
摘要
A glazing incidence X-ray fluorescence analysis (GIXF) has been applied to forensic samples: a counterfeit 100-dollar bill, fragments of polyvinyl tapes, a trace of semen, illegal drugs, fingerprints and fake V.S.O.P brandy. Strontium could not be detected on the magnet-respondent letter of the counterfeit bill and Br was detected on the magnet-nonrespondent part of the counterfeit bill, while such phenomena could not be noticed on a true bill. Fragments of black vinyl tapes related to a sexual assault case could be discriminated from each other. Zinc as a characteristic ingredient could be detected in a trace of semen. Bromine was detected in each of what is called a pure methamphetamine crystal and K, Ca, Fe, Zn etc. were detected in heroin powders. Lead was sharply detected in gunshot residues attached to a finger after gun-firing. Sulfur as a contaminant was abundant in fake V.S.O.P brandy, while no S was detected in genuine V.S.O.P brandy.
引用
收藏
页码:489 / 494
页数:6
相关论文
共 9 条
[1]  
NINOMIYA T, 1986, MEMOIRS OSAKA ELECTR, V22, P51
[2]  
NINOMIYA T, 1989, ADV XRAY ANAL, V32, P199
[3]  
NINOMIYA T, 1988, ADV XRAY CHEM ANAL J, V19, P227
[4]  
NINOMIYA T, 1990, J SURFACE SCI SOC JP, V11, P189
[5]  
Nomura S., 1992, ADV XRAY ANAL, V358, P969
[6]  
NOMURA S, 1988, ADV XRAY CHEM ANAL J, V19, P217
[7]  
NOMURA S, 1993, 42ND ANN DENV C APPL, P28
[8]   TOTAL REFLECTION X-RAY-FLUORESCENCE SPECTROMETRY [J].
TANIGUCHI, K ;
NINOMIYA, T .
TETSU TO HAGANE-JOURNAL OF THE IRON AND STEEL INSTITUTE OF JAPAN, 1990, 76 (08) :1228-1236
[9]   OPTICAL FLATS FOR USE IN X-RAY SPECTROCHEMICAL MICROANALYSIS [J].
YONEDA, Y ;
HORIUCHI, T .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1971, 42 (07) :1069-&