PREPARATION AND CHARACTERIZATION OF ZNXSR1-XS COMPOUND THIN-FILMS

被引:10
作者
LEE, ST [1 ]
KITAGAWA, M [1 ]
SUZUKAWA, R [1 ]
ICHINO, K [1 ]
KOBAYASHI, H [1 ]
机构
[1] TOTTORI UNIV,DEPT ELECT & ELECTR ENGN,TOTTORI 680,JAPAN
关键词
D O I
10.1016/0022-0248(95)00206-5
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
ZnxSr1-xS thin films were prepared, for the first time, in the whole composition range by radio frequency (RF) sputtering as a thermally nonequilibrium deposition method. The possibility of existence of ZnxSr1-xS solid solutions was systematically investigated from the results of thin film growth, in terms of structural and optical characteristics. Despite a general idea of insolubility between ZnS and SrS compounds, it has been found that for 0.86-0.91 less than or equal to x less than or equal to 1 Zn-rich ZnxSr1-xS, solid solutions with a single-phased zincblende structure were formed and for 0 less than or equal to x less than or equal to 0.29 Sr-rich ZnxSr1-xS, solid solutions with a single-phased rocksalt structure were formed. In the intermediate wide composition range 0.3 less than or equal to x less than or equal to 0.86-0.91, the miscibility gap including phase separation regions was observed. A deposition mechanism is proposed and the phase transition from rocksalt to zincblende structure is also discussed based on the fraction of ionic character f(i) for ZnS and SrS.
引用
收藏
页码:339 / 350
页数:12
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