MAGNETIC-FIELD SENSING WITH MAGNETOSTRICTIVE MATERIALS USING A TUNNELING TIP DETECTOR

被引:27
作者
WANDASS, JH [1 ]
MURDAY, JS [1 ]
COLTON, RJ [1 ]
机构
[1] USN,RES LAB,DIV CHEM,WASHINGTON,DC 20375
来源
SENSORS AND ACTUATORS | 1989年 / 19卷 / 03期
关键词
D O I
10.1016/0250-6874(89)87074-X
中图分类号
O65 [分析化学];
学科分类号
070302 ; 081704 ;
摘要
引用
收藏
页码:211 / 225
页数:15
相关论文
共 44 条
[1]   ATOMIC RESOLUTION IMAGING OF A NONCONDUCTOR BY ATOMIC FORCE MICROSCOPY [J].
ALBRECHT, TR ;
QUATE, CF .
JOURNAL OF APPLIED PHYSICS, 1987, 62 (07) :2599-2602
[2]   ATOMIC FORCE MICROSCOPE [J].
BINNIG, G ;
QUATE, CF ;
GERBER, C .
PHYSICAL REVIEW LETTERS, 1986, 56 (09) :930-933
[3]   ATOMIC RESOLUTION WITH ATOMIC FORCE MICROSCOPE [J].
BINNIG, G ;
GERBER, C ;
STOLL, E ;
ALBRECHT, TR ;
QUATE, CF .
EUROPHYSICS LETTERS, 1987, 3 (12) :1281-1286
[4]   TUNNELING THROUGH A CONTROLLABLE VACUUM GAP [J].
BINNIG, G ;
ROHRER, H ;
GERBER, C ;
WEIBEL, E .
APPLIED PHYSICS LETTERS, 1982, 40 (02) :178-180
[5]  
BINNIG G, 1982, HELV PHYS ACTA, V55, P726
[6]   ATOMIC RESOLUTION WITH ATOMIC FORCE MICROSCOPE [J].
BINNIG, G ;
GERBER, C ;
STOLL, E ;
ALBRECHT, TR ;
QUATE, CF .
SURFACE SCIENCE, 1987, 189 :1-6
[7]   SINGLE-TUBE 3-DIMENSIONAL SCANNER FOR SCANNING TUNNELING MICROSCOPY [J].
BINNIG, G ;
SMITH, DPE .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1986, 57 (08) :1688-1689
[8]   SURFACE STUDIES BY SCANNING TUNNELING MICROSCOPY [J].
BINNING, G ;
ROHRER, H ;
GERBER, C ;
WEIBEL, E .
PHYSICAL REVIEW LETTERS, 1982, 49 (01) :57-61
[9]  
Bozorth RM, 1951, FERROMAGNETISM, P845
[10]  
BROWN WF, 1966, MAGNETOELASTIC INTER, P71