A NEW EMISSION BAND RELATED TO EL2 IN GAAS

被引：1

作者：

MORI, Y ^{[1
]}

YOSHIMURA, Y ^{[1
]}

KAMODA, H ^{[1
]}

OHKURA, H ^{[1
]}

CHIBA, Y ^{[1
]}

机构：

[1] SCI UNIV TOKYO, DEPT APPL PHYS, TOKYO 162, JAPAN

来源：

JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS | 1989年 / 28卷 / 12期

关键词：

D O I：

10.1143/JJAP.28.L2122

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：L2122 / L2124

页数：3

共 20 条

[11] NEW CONFIGURATION-COORDINATE MODEL FOR THE GROUND, EXCITED, AND METASTABLE STATES OF EL-2 IN GAAS [J].

MOCHIZUKI, Y ;

IKOMA, T .

PHYSICAL REVIEW LETTERS, 1987, 59 (05) :590-593

[12] DYNAMIC RELAXATION PROCESSES OF OPTICALLY-EXCITED F-CENTERS STUDIED BY THE RESONANT SECONDARY-EMISSION [J].

MORI, Y ;

HANZAWA, H ;

OHKURA, H .

JOURNAL OF LUMINESCENCE, 1987, 38 (1-6) :159-163

[13] ANALYSIS OF PHOTOASSISTED THERMAL RECOVERY OF METASTABLE EL2 DEFECTS IN GAAS [J].

PARKER, JC ;

BRAY, R .

PHYSICAL REVIEW B, 1988, 37 (11) :6368-6376

[14] HOLE PHOTOIONIZATION CROSS-SECTIONS OF EL2 IN GAAS [J].

SILVERBERG, P ;

OMLING, P ;

SAMUELSON, L .

APPLIED PHYSICS LETTERS, 1988, 52 (20) :1689-1691

[15] RECOVERY EFFECT OF DEEP LEVEL LUMINESCENCE INDUCED BY BELOW BAND-GAP EXCITATION IN GAAS [J].

TAJIMA, M .

JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 1985, 24 (01) :L47-L49

[16] RADIATIVE RECOMBINATION MECHANISM OF EL2 LEVEL IN GAAS [J].

TAJIMA, M .

JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 1987, 26 (06) :L885-L888

[17] RESONANCE AND RELAXATION IN LIGHT-SCATTERING [J].

TOYOZAWA, Y .

JOURNAL OF THE PHYSICAL SOCIETY OF JAPAN, 1976, 41 (02) :400-411

[18] INTRACENTER TRANSITION IN EL2 OBSERVED IN PHOTOCURRENT SPECTRUM [J].

TSUKADA, N ;

KIKUTA, T ;

ISHIDA, K .

JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 1985, 24 (05) :L302-L304

[19] PHOTOELECTRIC MEMORY EFFECT IN GAAS [J].

VINCENT, G ;

BOIS, D ;

CHANTRE, A .

JOURNAL OF APPLIED PHYSICS, 1982, 53 (05) :3643-3649

[20] IDENTIFICATION OF A DEFECT IN A SEMICONDUCTOR - EL2 IN GAAS [J].

VONBARDELEBEN, HJ ;

STIEVENARD, D ;

DERESMES, D ;

HUBER, A ;

BOURGOIN, JC .

PHYSICAL REVIEW B, 1986, 34 (10) :7192-7202

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