SIMPLE, HIGH-RESOLUTION INTERFEROMETER FOR THE MEASUREMENT OF FREQUENCY-DEPENDENT COMPLEX PIEZOELECTRIC RESPONSES IN FERROELECTRIC CERAMICS

In this paper, we report the development of a simple but precise piezoelectric spectrometer using a Michelson-Morley interferometer. The measurement system has been developed to study the frequency and temperature dependence of the complex piezoelectric and electrostriction coefficients of ferroelectric materials. The spectral data are collected by computer and has significantly wider frequency range and lower noise than other such systems. Results are reported for a quartz sample, a La-modified lead zirconate titanate ferroelectric, and a lead zirconate titanate sol-gel derived ferroelectric thin film. © 1995 American Institute of Physics.